Assunto "001 Gaas"

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Assunto "001 Gaas"

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  • ASPNES, DE; KAMIYA, I; TANAKA, H; BHAT, R; FLOREZ, LT; HARBISON, JP; QUINN, WE; TAMARGO, M; GREGORY, S; PUDENZI, MAA; SCHWARZ, SA; BRASIL, MJSP; NAHORY, RE (LausanneSuíçaElsevier Science Sa, 1993)
    We summarize recent applications of two real-time optical diagnostic techniques, reflectance difference spectroscopy (RDS) and spectroellipsometry (SE), to epitaxial growth on GaAs and atomic layer epitaxy (ALE) in particular. ...